The Surface Skirt in Gaseous Scanning Electron Microscope (GSEM)
نویسندگان
چکیده
منابع مشابه
Gaseous Scanning Electron Microscope (GSEM): Applications and Improvement
The imaging and the microanalysis of hydrated and insulating materials using electron beam probe methods (Conventional SEM, Auger Electron Microscopy,...) are very limited by the necessity to keep the sample under high vacuum and the presence of the charge effect. In this case the sample must be coated except when the experiment is performed at very low energy in order to avoid the charge pheno...
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ژورنال
عنوان ژورنال: Microscopy Research
سال: 2013
ISSN: 2329-3306,2329-3314
DOI: 10.4236/mr.2013.13006